Loading...
Loading...
Loading...
 
DetectX: Jewellery Intelligence Challenge
DetectX invites visionary startups, deeptech innovators, and machine vision disruptors to reimagine quality inspection in one of India’s high-volume jewellery production environments.
Last date to apply: 29th Aug 2025
Apply Now
The challenge is to develop an AI-powered, fully automated inspection system that can accurately identify microscopic defects in intricately designed jewellery pieces; reducing human error, increasing throughput, and setting new standards in precision quality control.
 
 
 
 
Focus Area
Automated Quality Inspection of Jewellery Products: Current inspection systems are manual, labor-intensive, and prone to human error, especially when dealing with thousands of SKUs and intricate design variations. DetectX seeks AI-first, frugal, and scalable solutions that can detect:

  • Soldering defects / cuts
  • Missing components or stones
  • Missing or damaged branding/logo markings

Solutions must demonstrate high precision, rapid inspection speeds, and ease of use for operators with minimal technical expertise.
 
 
 
Why Apply?
  • Pilot Opportunity: Work directly with a leading national jewellery manufacturer
  • Real-world validation: Deploy your solution across a vast distributed production and vendor ecosystem
  • Product-Market Fit: Co-develop with on-ground operational teams for high adoption potential
  • Scale & Visibility: Opportunity to scale across multiple sites post successful validation
  • Technical Challenge: Apply your AI, vision, or automation tech to a high-complexity, high-impact problem
  • No Equity Taken: This is a pure challenge, not a funding program, your IP remains yours
 
 
 
FAQs
Startups, SMEs, technology solution providers with proven capabilities in machine vision, AI inspection systems, or related industrial automation
No. Experience in machine vision for quality inspection in any high-precision industry (electronics, medical devices, packaging, PCBs, etc.) is highly relevant
Yes. Shortlisted applicants will gain access to anonymized defect image sets or physical samples during the pilot scoping phase under NDA
No direct funding is provided at the application stage. However, pilot support, operational guidance, and potential for commercial deployment exist for selected solutions.
 
 
 
For more information, please write to:
Ms Vaishnavi Reddy    
vaishnavi.reddy@cii.in